Detecting bad design and bias from patents

DS 109: Proceedings of the Design Society: 23rd International Conference on Engineering Design (ICED21)

Year: 2021
Author: Melluso, N., Pardelli, S., Fantoni, G., Chiarello, F., & Bonaccorsi, A.
Series: ICED
DOI number: 10.1017/pds.2021.117
ISSN: 2732-527X

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